An advanced data compaction approach for test-during burn-in

Author

Schneider, Birger ; Oestergaard, Peter

Author_Institution

Elektronik Centralen, Horsholm, Denmark

fYear

1988

fDate

12-14 Sep 1988

Firstpage

381

Lastpage

390

Abstract

A novel burn-in system approach, using data compaction, test generation tools, and a flexible, general-purpose test system architecture is described. The approach offers true output monitoring of multioutput devices, featuring monitoring capabilities of 1-2000 test points per burn-in board. The approach is also well suited for testing of analog parts during burn-in, or may find usage for individual stimuli of ECL (emitter-coupled logic) parts. The strategy applies takes advantage of a flexible, general-purpose system approach-developed for this purpose-combined with the use of signature analysis approaches similar to those applied in many built-in self-test applications

Keywords

automatic test equipment; automatic testing; data compression; emitter-coupled logic; printed circuit testing; BITCOM; ECL; analog parts; burn-in board; data compaction; emitter-coupled logic; general-purpose test system architecture; multioutput devices; test generation tools; true output monitoring; Application specific integrated circuits; Compaction; Computer aided engineering; Life testing; Microprocessors; Monitoring; Performance evaluation; Quality assurance; System testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-8186-0870-6

Type

conf

DOI

10.1109/TEST.1988.207825

Filename

207825