• DocumentCode
    3112264
  • Title

    A novel approach to generate artificial outliers for support vector data description

  • Author

    Wang, Chi-Kai ; Ting, Yung ; Liu, Yi-Hung ; Hariyanto, Gunawan

  • Author_Institution
    Dept. of Mech. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
  • fYear
    2009
  • fDate
    5-8 July 2009
  • Firstpage
    2202
  • Lastpage
    2207
  • Abstract
    In this paper, we propose a novel approach to generate artificial outliers for support vector data description with boundary value method. In SVDD, the width parameter S and the penalty parameter C influence the learning results. The N-fold M times cross-validation is well-known and popular scheme to calculate the best (C, S) values. To automatically optimize the identification rate, we need more outliers. Due to this reason, we utilize boundary value in any two dimensions randomly to generalize new outliers. At the last, we use three benchmark data sets: iris, wine, and balance-scale data base to validate the approach in this research has better classification result and faster performance.
  • Keywords
    boundary-value problems; learning (artificial intelligence); optimisation; pattern classification; support vector machines; N-fold M times cross-validation scheme; SVDD; artificial outlier generation; balance-scale database; boundary value method; iris database; machine learning; optimisation; pattern classification; penalty parameter; support vector data description; width parameter; wine database; Industrial electronics; Instruments; Interpolation; Iris; Kernel; Mechanical engineering; Support vector machine classification; Support vector machines; N-fold M times cross-validation; Support Vector Data Description (SVDD); boundary value method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4347-5
  • Electronic_ISBN
    978-1-4244-4349-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2009.5214421
  • Filename
    5214421