• DocumentCode
    3113443
  • Title

    A comparative assessment of Schottky-Barrier Source/Drain GAA MOSFET with conventional and junctionless GAA MOSFETs

  • Author

    Kumar, Manoj ; Gupta, R.S. ; Haldar, Subhasis ; Gupta, Madhu

  • Author_Institution
    Dept. of ECE, Maharaja Agrasen Inst. of Technol., Rohini Delhi, India
  • fYear
    2013
  • fDate
    13-15 Dec. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A comparative assessment of Dual Material Gate (DMG) Schottky-Barrier (SB) Source/Drain (S/D) Gate All Around (GAA) MOSFET is carried out with conventional DMG-GAA having doped S/D MOSFET and DMG Junctionless GAA MOSFET. The RF/Analog performance like transconductance generation factor (gm/IDS), intrinsic gain (gm/gd), cut-off frequency (ft), and Ion/Ioff of these devices is studied using ATLAS-3D Device Simulator. The result shows that the Schottky-Barrier Source/Drain GAA MOSFET is superior to other two devices in all the electrical and high frequency parameters except Ion/Ioff ratio. MOSFET with metal S/D shows the faster performance due to low parasitic S/D resistance offered by SB-S/D. So it can be used for low power, faster switching and high frequency applications.
  • Keywords
    MOSFET; Schottky barriers; ATLAS-3D device simulator; DMG-GAA; S/D MOSFET; Schottky-barrier drain GAA MOSFET; Schottky-barrier source GAA MOSFET; comparative assessment; dual material gate; gate all around MOSFET; junctionless GAA MOSFET; metal S/D; parasitic S/D resistance; transconductance generation factor; Doping; Gain; Logic gates; MOSFET; Metals; Performance evaluation; Transconductance; ATLAS-3D; Dual Material Gate (DMG); Junctionless GAA; Schottky-Barrier Source/Drain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Conference (INDICON), 2013 Annual IEEE
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4799-2274-1
  • Type

    conf

  • DOI
    10.1109/INDCON.2013.6726127
  • Filename
    6726127