DocumentCode
311495
Title
Fault coverage of a long random test sequence estimated from a short simulation
Author
Prepin, Valérie ; David, René
Author_Institution
Lab. d Autom. de Grenoble, France
fYear
1997
fDate
27 Apr-1 May 1997
Firstpage
391
Lastpage
398
Abstract
Forecasting the fault coverage of a long random test sequence from the results obtained from the simulation of a short test sequence looks like an inaccessible dream. As a matter of fact, a short test sequence detects mainly easy to detect faults, while the test length required for a fault coverage close to 1 depends mainly (almost only) on the most difficult faults. A new 2-parameter model, linking the fault coverage to the test length, was proposed recently. Although these parameters are very difficult to obtain, they can be roughly estimated from a relatively short simulation. According to a previous comment, the results can not be accurate. However, they are more accurate that ones obtained from other models proposed in the literature
Keywords
circuit analysis computing; fault diagnosis; integrated circuit testing; parameter estimation; sequences; fault coverage estimation; long random test sequence; short simulation; two-parameter model; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Electrical fault detection; Electrical resistance measurement; Fault detection; Joining processes; Length measurement; Predictive models;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location
Monterey, CA
ISSN
1093-0167
Print_ISBN
0-8186-7810-0
Type
conf
DOI
10.1109/VTEST.1997.600315
Filename
600315
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