• DocumentCode
    311495
  • Title

    Fault coverage of a long random test sequence estimated from a short simulation

  • Author

    Prepin, Valérie ; David, René

  • Author_Institution
    Lab. d Autom. de Grenoble, France
  • fYear
    1997
  • fDate
    27 Apr-1 May 1997
  • Firstpage
    391
  • Lastpage
    398
  • Abstract
    Forecasting the fault coverage of a long random test sequence from the results obtained from the simulation of a short test sequence looks like an inaccessible dream. As a matter of fact, a short test sequence detects mainly easy to detect faults, while the test length required for a fault coverage close to 1 depends mainly (almost only) on the most difficult faults. A new 2-parameter model, linking the fault coverage to the test length, was proposed recently. Although these parameters are very difficult to obtain, they can be roughly estimated from a relatively short simulation. According to a previous comment, the results can not be accurate. However, they are more accurate that ones obtained from other models proposed in the literature
  • Keywords
    circuit analysis computing; fault diagnosis; integrated circuit testing; parameter estimation; sequences; fault coverage estimation; long random test sequence; short simulation; two-parameter model; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Electrical fault detection; Electrical resistance measurement; Fault detection; Joining processes; Length measurement; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1997., 15th IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7810-0
  • Type

    conf

  • DOI
    10.1109/VTEST.1997.600315
  • Filename
    600315