• DocumentCode
    3115339
  • Title

    Closed-form expressions for determining approximate PMC boundaries around an aperture in a metal cavity wall

  • Author

    De Paulis, Francesco ; Zhang, Yaojiang ; Fan, Jun ; Mix, Jason ; Dong, Xiaopeng ; Hua, Daniel ; Slattery, Kevin

  • Author_Institution
    EMCLab, Missouri Univ. of Sci. & Technol., Rolla, MO
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Modern electronic systems may use mixed RF/digital technologies to achieve various functionalities, which leads to various intra-system interference problems including the RF interference from noisy digital circuits to sensitive RF receivers, especially when the overall system is contained in a metal enclosure. A fast method based on a cavity formulation can be used to estimate the internal noise coupling mechanisms inside the enclosure. This method assumes that only the TMz0 mode exists inside the enclosure, i.e., the electric field along the z-direction is constant. The cavity formulation fails in the region adjacent to an aperture in an enclosure wall, since the aperture introduces higher order modes. The developed closed-form expressions compute the Ez-field variation along the z-direction. Thus, they can be used to estimate the breakpoint where the cavity method is no longer effective.
  • Keywords
    electromagnetic shielding; cavity method; closed form expression; electric field variation; field variation; metal cavity wall; mixed RF-digital technology; perfect metallic conductor boundary; Apertures; Circuit noise; Closed-form solution; Coupling circuits; Digital circuits; Electromagnetic interference; Geometry; Magnetic resonance; Radio frequency; Solid modeling; Cavity method; Closed-form expressions; Electric field variation; Perfect Magnetic Conductor (PMC); RF interference;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652122
  • Filename
    4652122