Title :
Estimation of the statistical variation of crosstalk in wiring harnesses
Author :
Wu, Meilin ; Beetner, Daryl ; Hubing, Todd ; Ke, Haixin ; Sun, Shishuang
Author_Institution :
UMR/MS&T Electromagn. Compatibility Lab., Missouri Univ. of Sci. & Technol., Rolla, MO
Abstract :
Analyzing interference problems in vehicle wiring harnesses requires fast and accurate methods of approximating crosstalk. Worst-case approximations using lumped element models are fast and easy to use, but run the risk of overestimating problems. Statistical methods that account for the random variation of wire position help prevent overdesign, but are often difficult and time-consuming to apply and lack a clear link between problems and their cause. Here we investigate the use of simple lumped-element models to predict the statistical variation of crosstalk in wire harness bundles. Models are based on lumped-element approximations, where inductance and capacitance values are calculated for a single bundle cross-section, and only the circuit position is varied. Accuracy was evaluated by comparing results to numerical simulations. The method does a good job of quickly predicting the reasonable worst-case values of crosstalk due to inductive or capacitive coupling.
Keywords :
approximation theory; automotive electronics; crosstalk; electromagnetic compatibility; electromagnetic wave interference; random processes; statistical analysis; crosstalk statistical variation estimation; electromagnetic compatibility; interference problem; lumped element model; random variation; single bundle cross-section; vehicle wiring harness; wire position; worst-case crosstalk approximation; Capacitance; Circuits; Crosstalk; Inductance; Interference; Predictive models; Statistical analysis; Vehicles; Wire; Wiring; Approximation methods; crosstalk; harness; modeling; statistics; vehicles;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652132