DocumentCode :
3115851
Title :
Developing the mesoscale stress-strain curve to failure
Author :
Iwamoto, Nancy
Author_Institution :
Honeywell Specialty Materials, USA
fYear :
2011
fDate :
18-20 April 2011
Firstpage :
42376
Lastpage :
42558
Abstract :
Developing the stress response using the molecular and mesoscale levels is fairly reliable during the initial strain. For instance, modulus is a property that can be established using these techniques and the continuity of scale suggests that both may be used to establish modulus for parameterizing a macroscale model when measured properties are unavailable. However, the latter part of the stress/strain response that helps to establish ties to crack propagation still needs attention. One problem that was previously found was questionable lack of void formation in crosslinked systems due to superficially clean adhesive separation in the simulations. One way to overcome this lack of voiding was to determine how to develop bond breakage criterion that would allow surfaces to develop. This paper discusses development and application of bond breakage, and the impact on the simulated stress/strain curves using mesoscale models.
Keywords :
adhesive bonding; copper compounds; resins; stress-strain relations; Cu2O; adhesive separation; bond breakage; failure; mesoscale models; mesoscale stress-strain curve; Adhesives; Data models; Deformable models; Energy states; Plastics; Strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
Conference_Location :
Linz
Print_ISBN :
978-1-4577-0107-8
Type :
conf
DOI :
10.1109/ESIME.2011.5765759
Filename :
5765759
Link To Document :
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