• DocumentCode
    3116158
  • Title

    Noise coupling between power/ground nets due to differential vias transitions in a multilayer PCB

  • Author

    Cocchini, Matteo ; Fan, Jun ; Archambeault, Bruce ; Knighten, James L. ; Chang, Xin ; Drewniak, James L. ; Zhang, Yaojiang ; Connor, Samuel

  • Author_Institution
    UMR/MST EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Due to the increase in board density, routing traces on different layers becomes a widely used strategy. Through-hole vias are often used to connect these traces. Those vias that penetrate power/ground plane pairs could cause noise coupling between signal and power/ground nets. At the same time, the need for clean signal transmitted to receivers results in a wide use of differential signals. This paper studies the noise coupling mechanism caused by a differential pair of vias penetrating power/ground plane pair using a physics-based via-plane model combined with transmission line models for traces. A 26-layer printed circuit board with a pair of differential vias have been modeled. The simulated results clearly demonstrate the impact of ground vias and via stubs on noise coupling.
  • Keywords
    electromagnetic coupling; network routing; printed circuits; transmission lines; differential vias transition; ground nets; multilayer PCB; noise coupling; physics-based via-plane model; power nets; printed circuit board; routing trace; transmission line model; Capacitors; Circuit noise; Coupling circuits; Geometry; Microstrip; Noise generators; Nonhomogeneous media; Power transmission lines; Printed circuits; Stripline; Differential signal; cavity model; ground vias; noise coupling between signal and power/ground nets; signal via transition; via capacitance; via stub;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652163
  • Filename
    4652163