Title :
Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits
Author :
Wong, W.W. ; Liou, J.J. ; Yuan, J.S. ; Wu, D.M.
Author_Institution :
Dept. of Electr. Eng., Univ. of Central Florida, Orlando, FL, USA
Abstract :
A computer-aided design tool for testing MOSFET integrated circuit performance as functions of MOSFET channel length and channel width variations is presented. The numerical model, which is developed based on the Tellegen´s theorem and a database that contains the statistical information of MOSFET process parameters, is implemented in SPICE2 circuit simulator. Sensitivity simulation of a MOSFET operational amplifier is carried out to illustrate the usefulness of the present work.<>
Keywords :
MOS integrated circuits; circuit CAD; digital simulation; insulated gate field effect transistors; MOSFET integrated circuits; SPICE2 circuit simulator; Tellegen´s theorem; channel length; channel width; computer-aided design tool; numerical model; operational amplifier; sensitivity simulation; statistical information; Circuit simulation; Circuit testing; Computational modeling; Databases; Integrated circuit modeling; Integrated circuit testing; MOSFET circuits; Network topology; Sensitivity analysis; Voltage;
Conference_Titel :
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location :
Atlantic City, NJ, USA
DOI :
10.1109/VTEST.1991.208141
