DocumentCode :
3117204
Title :
Magnetic probe method
Author :
Shimasaki, Toshiki
Author_Institution :
NEC Eng., Ltd., Tokyo
fYear :
2008
fDate :
18-22 Aug. 2008
Firstpage :
1
Lastpage :
4
Abstract :
A collection of slides from the authors´ conference presentation is given.
Keywords :
electric current measurement; large scale integration; LSI; SSCD effect; VDD terminal; frequency 1 GHz to 3 GHz; high frequency power current measurement; magnetic probe method; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
Type :
conf
DOI :
10.1109/ISEMC.2008.4652219
Filename :
4652219
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3117204
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