DocumentCode
3117271
Title
Coulomb interactions between dust particles in plasma etching reactors
Author
Hwang, H.H. ; Kushner, M.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear
1996
fDate
3-5 June 1996
Firstpage
281
Abstract
Summary form only given. We discuss results from a computer model for dust particle transport in reactive ion etching discharges where particle-particle Coulomb interactions are included. The basis of this study is a previously described dust transport simulation (DTS) which calculates particle trajectories by integrating the equations of motion due to the sum of the appropriate forces. Debye shielded Coulomb interactions between dust particles have been added to the DTS on a particle-by-particle basis. Results from the DTS indicate that particle-particle interactions modify trapping locations from localized points to extended sheets. Clouds or domes of particles typically observed above wafers are largely a consequence of particle-particle interactions which redistribute particles on nearly equipotential surfaces.
Keywords
sputter etching; Debye shielded Coulomb interactions; computer model; dust particle transport; dust transport simulation; equipotential surfaces; particle trajectories; particle-particle Coulomb interactions; plasma etching reactors; reactive ion etching discharges; Dusty plasma; Etching; Inductors; Optical fiber sensors; Plasma applications; Plasma density; Plasma displays; Plasma materials processing; Plasma temperature; Plasma transport processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location
Boston, MA, USA
ISSN
0730-9244
Print_ISBN
0-7803-3322-5
Type
conf
DOI
10.1109/PLASMA.1996.551626
Filename
551626
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