Title :
A flexible scheme for adaptive integration time control [CMOS image sensor]
Author :
Breidenassel, Andreas ; Meier, Karlheinz ; Schemmel, Johannes
Author_Institution :
Kirchhoff-Inst. for Phys., Heidelberg Univ., Germany
Abstract :
A scheme to regulate the integration time in an array of charge integrators, independent of the individual discharging rate, is presented. The regulation scheme can be used for the design of high dynamic range imagers. It has been implemented in a prototype imager realized in a standard 0.25 μm CMOS technology, offering a resolution of 170×170 pixels with a pitch of 75 μm. A movable window allows the selection of the region of interest where high dynamic range capability is desired. Experimental results show a dynamic range of 135 dB.
Keywords :
CMOS image sensors; adaptive signal processing; integrating circuits; 0.25 micron; 170 pixel; 28900 pixel; 75 micron; APS; CMOS image sensor; adaptive integration time control; charge integrator array; high dynamic range imagers; imager resolution; integrator discharge rate; movable region of interest selection window; Adaptive control; Artificial neural networks; CMOS technology; Dynamic range; Image reconstruction; Image sampling; Image storage; Layout; Pixel; Programmable control;
Conference_Titel :
Sensors, 2004. Proceedings of IEEE
Print_ISBN :
0-7803-8692-2
DOI :
10.1109/ICSENS.2004.1426156
