DocumentCode :
3118313
Title :
Low temperature mechanical properties of nanocrystalline diamond films
Author :
Metcalf, Thomas H. ; Houston, Brian H. ; Butler, James E. ; Feygelson, Tatyana
Author_Institution :
Naval Res. Lab., Washington , DC
fYear :
2006
fDate :
38869
Firstpage :
192
Lastpage :
195
Abstract :
Measurements of the mechanical properties - internal friction and shear modulus - of several nanocrystalline diamond films grown on silicon resonator substrates is reported. The internal friction measurements of 0.5 mum boron-doped and boron-free nanocrystalline diamond films show that the boron concentration does not appear to be correlated with the previously reported internal friction peak at 1-2 K. Rather, a heavily boron-doped film appears to have an internal friction peak at 10 K. The low-temperature internal friction of these films is consistent with that of films reported upon earlier, and is in the range 2 times 10-6 les Q-1 les 6 times 10-6
Keywords :
boron; cryogenics; diamond; internal friction; nanostructured materials; semiconductor thin films; shear modulus; 0.5 micron; 1 to 2 K; 10 K; B; boron-doped film; internal friction measurements; nanocrystalline diamond films; shear modulus; silicon resonator substrates; Fabrication; Film bulk acoustic resonators; Frequency; Friction; Leg; Mechanical factors; Neck; Semiconductor films; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0074-0
Electronic_ISBN :
1-4244-0074-0
Type :
conf
DOI :
10.1109/FREQ.2006.275376
Filename :
4053754
Link To Document :
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