Title :
Parameter estimation in strongly nonlinear circuits
Author :
Van Den Eijnde, Eli ; Schoukens, Johan
Author_Institution :
Vrije Univ. Brussels, Belgium
Abstract :
The combination of the generalized Volterra approach to computing the nonlinear steady-state output and a maximum likelihood estimator results in a powerful parameter estimation method for strongly nonlinear circuits. As a result, it is possible to determine parameters which cannot be measured or are difficult to measure. The proposed approach is illustrated by the example of an inverting amplifier built around an operational amplifier causing slew-induced distortion
Keywords :
electric distortion; estimation theory; nonlinear network analysis; operational amplifiers; parameter estimation; generalised Volterra series; inverting amplifier; maximum likelihood estimator; nonlinear circuits; operational amplifier; parameter estimation; slew-induced distortion; Distortion measurement; Frequency domain analysis; Linear circuits; Maximum likelihood estimation; Nonlinear circuits; Nonlinear systems; Operational amplifiers; Parameter estimation; Parametric statistics; Steady-state;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
Conference_Location :
San Jose, CA
DOI :
10.1109/IMTC.1990.66041
