DocumentCode :
3120255
Title :
New Temperature Compensated Sapphire-Rutile Resonator Oscillator
Author :
Kersalé, Y. ; Boubekeur, N. ; Chaubet, M. ; Bazin, N. ; Giordano, V.
Author_Institution :
Dept. of LPMO, Univ. de Franche-Comte, Besancon, WA
fYear :
2006
fDate :
38869
Firstpage :
695
Lastpage :
698
Abstract :
The paper presents the characterization of a new microwave temperature compensated sapphire-rutile resonator oscillator. The oscillator frequency instability performances are better than 2 times 10-13 for tau < 1000s, and the frequency drift is estimated at 2.5 times10-12/day. These medium and long term results constitute, up to now, the state of the art for microwave temperature compensated sapphire resonator oscillator
Keywords :
crystal resonators; frequency stability; microwave oscillators; sapphire; titanium compounds; frequency instability; microwave oscillators; sapphire-rutile resonator oscillator; Dielectric losses; Dielectric thin films; Electromagnetic heating; Frequency estimation; Microwave oscillators; Plasma temperature; Q factor; Sputtering; Temperature sensors; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0074-0
Electronic_ISBN :
1-4244-0074-0
Type :
conf
DOI :
10.1109/FREQ.2006.275472
Filename :
4053850
Link To Document :
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