DocumentCode
31206
Title
Development of Multiharmonic Verification Artifact for the LSNA and NVNA (MTT-11)
Author
Haedong Jang ; Youngseo Ko ; Roblin, Patrick
Author_Institution
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Volume
14
Issue
1
fYear
2013
fDate
Jan.-Feb. 2013
Firstpage
134
Lastpage
139
Abstract
In this article, a unique approach is presented to design and fabricate a circuit, rich in nonlinear contents with reduced sensitivity to bias, temperature, and load variations so that it can be used to validate the performance of LSNAs or NVNAs. This circuit was judged to be a joint winner in the 2012 IEEE MTT-S International Microwave Symposium (IMS2012) Student Design Competition, Design of a Calibration Verification Artifact for Nonlinear VNA, sponsored by MTT-11 Microwave Measurements.
Keywords
network analysers; LSNA; MTT-11 Microwave Measurements; NVNA MTT-11; large-signal vector network analyzers; multiharmonic verification artifact design; nonlinear VNA; nonlinear contents; nonlinear vector network analyzer; Calibration; Frequency measurement; Harmonic analysis; Logic gates; Phase measurement; Radio frequency; Vector network analysis; Voltage measurement;
fLanguage
English
Journal_Title
Microwave Magazine, IEEE
Publisher
ieee
ISSN
1527-3342
Type
jour
DOI
10.1109/MMM.2012.2226640
Filename
6421088
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