Title :
The Impending Crisis In Analog Test
Author_Institution :
Texas Instruments
Keywords :
Automatic testing; Circuit testing; Costs; Crisis management; Electronic equipment testing; Engineering management; Integrated circuit testing; Process design; Semiconductor device testing; Test equipment;
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
DOI :
10.1109/ISSCC.1991.689075
