DocumentCode
3123131
Title
ECON: A Kernel Basis Pursuit Algorithm with Automatic Feature Parameter Tuning, and its Application to Photometric Solids Approximation
Author
Loth, Manuel ; Preux, Philippe ; Delepoulle, Samuel ; Renaud, Christophe
Author_Institution
Team-Project SequeL, INRIA Lille Nord, Lille, France
fYear
2009
fDate
13-15 Dec. 2009
Firstpage
162
Lastpage
169
Abstract
This paper introduces a new algorithm, namely the equi-correlation network (ECON), to perform supervised classification, and regression. ECON is a kernelized LARS-like algorithm, by which we mean that ECON uses an l1 regularization to produce sparse estimators, ECON efficiently rides the regularization path to obtain the estimator associated to any regularization constant values, and ECON represents the data by way of features induced by a feature function. The originality of ECON is that it automatically tunes the parameters of the features while riding the regularization path. So, ECON has the unique ability to produce optimally tuned features for each value of the constant of regularization. We illustrate the remarkable experimental performance of ECON on standard benchmark datasets; we also present a novel application of machine learning in the field of computer graphics, namely the approximation of photometric solids.
Keywords
computer graphics; learning (artificial intelligence); pattern classification; photometry; regression analysis; ECON algorithm; automatic feature parameter tuning; computer graphics; equicorrelation network; kernel basis pursuit algorithm; kernelized LARS-like algorithm; machine learning; photometric solids approximation; regression; regularization constant value; regularization path; sparse estimator; supervised classification; Application software; Approximation algorithms; Computer graphics; Europe; Kernel; Machine learning; Photometry; Pursuit algorithms; Solids; Tellurium; application in computer graphics; automatic kernel parameter tuning; kernel method; l1 regularization; non parametric regression; regression; sparse regression; supervised classification; supervised learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Learning and Applications, 2009. ICMLA '09. International Conference on
Conference_Location
Miami Beach, FL
Print_ISBN
978-0-7695-3926-3
Type
conf
DOI
10.1109/ICMLA.2009.61
Filename
5381823
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