• DocumentCode
    3124141
  • Title

    A multi-modal 2D/3D registration scheme for preterm brain images

  • Author

    Vandemeulebroucke, Jef ; Vansteenkiste, Ewout ; Philips, Wilfried

  • Author_Institution
    Departamento de Automao e Sistemas, Univ. Fed. de Santa Catarina, Florianopolis
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    3341
  • Lastpage
    3344
  • Abstract
    Periventricular leukomalacia (PVL) is a neonatal brain pathology occuring on preterms with a very low birth weight (<1500 g). Next to ultrasound (US) imaging, which is the first and most common step, magnetic resonance image (MRI) volumes are used for the inspection of this pathology. Since on both modalities, up to now, we still lack a golden standard for the quantification of the pathology cross-validation through a multi-modal registration is highly beneficial to the clinical diagnosis. In this article we present a semi-automatic 2D US-3D MRI registration scheme combining an interactive initialization step, B-spline image interpolation, a mutual information based metric and an evolutionary algorithm optimization scheme
  • Keywords
    biomedical MRI; biomedical ultrasonics; brain; evolutionary computation; image registration; interpolation; medical image processing; obstetrics; optimisation; splines (mathematics); B-spline image interpolation; birth weight; clinical diagnosis; evolutionary algorithm optimization scheme; interactive initialization; magnetic resonance image; multimodal 2D-3D registration scheme; neonatal brain pathology; pathology cross-validation; periventricular leukomalacia; preterm brain images; semiautomatic 2D US-3D MRI registration scheme; ultrasound imaging; Brain; Clinical diagnosis; Inspection; Interpolation; Magnetic resonance; Magnetic resonance imaging; Pathology; Pediatrics; Spline; Ultrasonic imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260315
  • Filename
    4462513