• DocumentCode
    31256
  • Title

    Thermal Spreading Resistance and Heat Source Temperature in Compound Orthotropic Systems With Interfacial Resistance

  • Author

    Muzychka, Yuri S. ; Bagnall, Kevin R. ; Wang, E.N.

  • Author_Institution
    Dept. of Mech. Eng., Memorial Univ. of NewfoundlandNewfoundland, St. John´s, NL, Canada
  • Volume
    3
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    1826
  • Lastpage
    1841
  • Abstract
    In this paper, a new and more general solution for thermal spreading resistance in compound, orthotropic systems with interfacial resistance is considered. This new solution, which extends beyond previously published results, is obtained for a finite rectangular heat source of uniform strength arbitrarily located on a rectangular substrate. By means of superposition, one can obtain the temperature field in the source plane for multiple heat sources as well as the source mean and centroid temperatures. By means of orthotropic transformations, systems containing orthotropic materials can be easily modeled. Extension of the present solutions using a computationally efficient influence coefficient method is also given, such that the effects of large numbers of heat sources are superimposed. The application of these closed-form expressions for the temperature rise is demonstrated with calculations for Gallium nitride (GaN) high electron mobility transistors (HEMTs). These solutions are shown to be more flexible than previously reported analytical expressions and much more computationally efficient than 3-D finite element analysis, especially for a large number of discrete heat sources associated with multifinger GaN HEMTs.
  • Keywords
    III-V semiconductors; gallium compounds; high electron mobility transistors; thermal resistance; wide band gap semiconductors; GaN; HEMT; centroid temperatures; closed-form expressions; compound orthotropic systems; finite rectangular heat source; gallium nitride; heat source temperature; high electron mobility transistors; interfacial resistance; multiple heat sources; orthotropic transformations; rectangular substrate; source mean; thermal spreading resistance; Gallium nitride; Heating; Substrates; Thermal conductivity; Thermal resistance; Compound systems; GaN high electron mobility transistor (HEMT); Kirchhoff transform; electronics cooling; heat conduction; heat spreaders; interfacial resistance; orthotropic properties; thermal boundary resistance (TBR); thermal spreading resistance;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2013.2269273
  • Filename
    6556980