Title :
Wafer Scale Assembly and Test for the Production of Opto-Electronic Components
Author_Institution :
EZconn Europe GmbH, Berlin
Abstract :
The trend of rising performance in combination with the reduction of size is still valid in the opto-electronic technology. That implies not only higher integration of functions into the chip but also a miniaturization of the hybrid assembly. It is presented a micro-assembly production line which uses a wafer as basis for the assembly process with mum accuracy. This technology is well suited for volume production since several thousand micro-systems are processed and tested on one wafer
Keywords :
integrated optics; micro-optics; microassembling; optoelectronic devices; production testing; wafer-scale integration; micro-assembly production line; opto-electronic components; volume production; wafer scale assembly; wafer testing; Assembly; Costs; Manufacturing; Optical devices; Optical interconnections; Optical receivers; Optical sensors; Optical transmitters; Production; Testing;
Conference_Titel :
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9555-7
Electronic_ISBN :
0-7803-9555-7
DOI :
10.1109/LEOS.2006.278945