• DocumentCode
    3129477
  • Title

    Aging effects on interfacial reactions between Cu addition into the Sn-9Zn lead-free solder and Au substrate

  • Author

    Liou, Wei-kai ; Yen, Yee-wen ; Jao, Chien-Chung

  • Author_Institution
    Grad. Inst. of Mater. Sci. & Technol., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    271
  • Lastpage
    273
  • Abstract
    This study investigates aging effects on interfacial reactions between Sn-9wt%Zn-x wt% (SZ-xCu) alloys and Au substrate. The Au3Zn7/AuZn2/AuZn and Au3Zn7/AuZn phases respectively formed in the SZ/Au and SZ-1Cu/Au couples aged at 160°C for 24 hours. Only the AuSn phase was found at the SZ-4 Cu/Au interface. Extending the aging time to 800 hours, Sn became a dominant diffusion element. Binary Au-Sn phases and the metastable Au-Zn-Sn ternary phase, Au33-36 Zn35-36Sn29-31, was formed at the interface. The aging effect causing the changes of dominant diffusion element and concentration of Zn, Cu in the solder is the main reasons to change the sequence of the IMC formation in the SZ-xCu/Au systems.
  • Keywords
    copper; gold; solders; tin alloys; zinc alloys; Au; Au3Zn7-AuZn2-AuZn; Cu; IMC; Sn-Zn; aging effects; interfacial reactions; intermetallic compounds; lead-free solder; temperature 160 C; time 24 hour; time 800 hour; Aging; Automatic speech recognition; Environmentally friendly manufacturing techniques; Gold; Large-scale systems; Lead; Signal processing; Speech processing; Speech recognition; Vocabulary; Au33–36; SZ-xCu alloy; Zn35–36Sn29–31; aging effect; interfacial reactions; metastable;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382122
  • Filename
    5382122