• DocumentCode
    3129772
  • Title

    An investigation of thermal spreading device with thermal via in high power LEDs

  • Author

    Yang, Kai-Shing ; Wu, Yu-Lieh ; Chen, Ing-Young ; Wang, Chi-Chuan

  • Author_Institution
    Dept. of Electro-Opt. & Energy Eng., MingDao Univ., Changhua, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    195
  • Lastpage
    198
  • Abstract
    A detailed numerical simulation of the performance of thermal module having ¿thermal via¿ is made in this study. The results indicate the temperature distributions from the numerical simulation are significantly affected by spreading resistance. The filled thermal via can considerably improve the performance of thermal module. For further explanation of the significant drop of junction and thermal resistance at sub-mount with thermal via, the detailed thermal resistances distribution in the thermal module are further examined. It is found that the significant drop of thermal resistance is mainly from package level with the help of thermal via filled in submount. However, the effect of PCB on the thermal resistance is quite different for the simulated geometries, a ¿maximum¿ ratio of thermal resistance of PCB had occurred. The thermal resistance of heat sink remains the same for all simulated case. With further adding the thermal via, the effect of heat sink on the overall resistance will become more and more pronounced.
  • Keywords
    heat sinks; light emitting diodes; numerical analysis; semiconductor device packaging; temperature distribution; heat sink; high power LED; light emitting diodes; numerical simulation; spreading resistance; temperature distributions; thermal module; thermal resistance distribution; thermal spreading device; thermal via; Light emitting diodes; EFD; LED; thermal resistance; thermal via;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382141
  • Filename
    5382141