• DocumentCode
    3130040
  • Title

    Characterization of gold electrodes in phosphate buffered saline solution by impedance and noise measurements for biological applications

  • Author

    McAdams, E.T. ; Jossinet, J. ; Subramanian, R. ; McCauley, R.G.E.

  • Author_Institution
    NIBEC, Ulster Univ., Jordanstown
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    4594
  • Lastpage
    4597
  • Abstract
    Impedance spectroscopy and noise measurements have been used to study gold electrodes of three different surface areas in phosphate buffered saline (PBS) solution. The gold-PBS solution interface can be modeled by a charge transfer resistance in parallel with an interfacial constant phase element (CPE) which are in series with the solution resistance. The voltage noise fluctuations were analyzed using the fast Fourier transform (FFT) method. It is found that the voltage noise power is characterized by a 1/falpha spectrum in the low frequency range. The value of alpha is observed to be double that of the CPE coefficient beta. The authors suggest a link between the interface impedance and the measured noise
  • Keywords
    1/f noise; biomedical electrodes; biomedical measurement; charge exchange; electric impedance; electrochemical electrodes; fast Fourier transforms; fluctuations; gold; surface chemistry; thermal noise; 1/falpha spectrum; Au; biomedical measurement; charge transfer resistance; fast Fourier transform method; gold electrodes; impedance spectroscopy; interfacial constant phase element coefficient; noise measurements; phosphate buffered saline solution; surface areas; voltage noise fluctuations; voltage noise power; Biological system modeling; Charge transfer; Electrochemical impedance spectroscopy; Electrodes; Gold; Immune system; Low-frequency noise; Noise measurement; Surface impedance; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260406
  • Filename
    4462825