DocumentCode
3130082
Title
Reliability of High-Power 1060-nm DBR Lasers
Author
Nguyen, Hung Khanh ; Coleman, Sean ; Visovsky, Nick J. ; Li, Yabo ; Song, Kechang ; Davis, Ronald W., Jr. ; Hu, Martin H. ; Loeber, David A. ; Zah, Chung-en
fYear
2006
fDate
Oct. 2006
Firstpage
587
Lastpage
588
Abstract
We report highly reliable 1060-nm DBR lasers with a single-wavelength output power larger than 350 mW and a failure rate as low as 3.2 kFITs at a heat-sink temperature of 25degC and a gain current of 500 mA. The reliability data of the high-power 1060-nm DBR lasers under longest aging tests at the highest level of current and temperature stress have been obtained for the first time, to the best of our knowledge
Keywords
distributed Bragg reflector lasers; laser beams; laser reliability; semiconductor lasers; 1060 nm; 25 C; 500 mA; DBR laser reliability; aging tests; current stress; failure rate; gain current; heat-sink temperature; high-power lasers; temperature stress; Accelerated aging; Distributed Bragg reflectors; Holography; Indium gallium arsenide; Optical modulation; Power generation; Power lasers; Quantum well lasers; Semiconductor lasers; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location
Montreal, Que.
Print_ISBN
0-7803-9555-7
Electronic_ISBN
0-7803-9555-7
Type
conf
DOI
10.1109/LEOS.2006.278795
Filename
4054320
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