Reset noise suppression in two-dimensional CMOS photodiode pixels through column-based feedback-reset

Author

Pain, B. ; Cunningham, T.J. ; Hancock, B. ; Yang, G. ; Seshadri, S. ; Ortiz, M.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

2002

fDate

8-11 Dec. 2002

Firstpage

809

Lastpage

812

Abstract

We present a new CMOS photodiode imager pixel with ultralow read noise through on-chip suppression of reset noise via column-based feedback circuitry. In a 0.5 /spl mu/m CMOS process, the pixel occupies only 10/spl times/10 /spl mu/m/sup 2/ area. Data from a 256/sup 2/ CMOS imager indicates imager operation with read noise as low as 6 electrons without employing on- or off-chip correlated double sampling. The noise reduction is achieved without introducing any image lag, and with insignificant reduction in quantum efficiency and full-well.

Keywords

CMOS image sensors; circuit feedback; integrated circuit noise; interference suppression; photodiodes; 0.5 micron; 2D CMOS photodiode pixels; CMOS photodiode imager; column-based feedback circuitry; column-based feedback-reset; high resolution imager; noise reduction; on-chip noise suppression; reset noise suppression; ultralow read noise; 1f noise; CMOS image sensors; CMOS technology; Circuit noise; FETs; Feedback circuits; Image sampling; Noise reduction; Photodiodes; Pixel;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 2002. IEDM '02. International

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-7803-7462-2

Type

conf

DOI

10.1109/IEDM.2002.1175961

Filename

1175961