Title :
Test and debug features of the RTO7 chip
Author :
Van Kaam, Kees ; Vermeulen, Bart ; Bergveld, Henk Jan
Author_Institution :
Philips Res. Labs., Eindhoven
Abstract :
The Philips RTO7 chip consists of a complete receive chain from RF up to and including digital demodulation for Bluetooth-like radio communication. This paper describes both the implementation and verification of the test and debugs hardware for the digital core of the RTO7. The core-based DfT and DfD flow of the RTO7 is presented. The experimental results show that the RTO7 is both a fully testable and debuggable chip. State dump analysis results are also presented, showing that the state dumps obtained in the application are 100% stable, and match the state dumps made in simulation, and on the digital test system
Keywords :
Bluetooth; design for testability; integrated circuit testing; radio links; radiofrequency integrated circuits; Bluetooth-like radio communication; Philips RTO7 chip; debug hardware; design-for-debug; design-for-testability; digital demodulation; digital test system; receive chain; state dump analysis; test hardware; Band pass filters; Communication standards; Demodulation; Design for disassembly; Digital filters; Filtering; Radio frequency; Radiofrequency amplifiers; Streaming media; Testing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1583985
