Test and debug features of the RTO7 chip

Author

Van Kaam, Kees ; Vermeulen, Bart ; Bergveld, Henk Jan

Author_Institution

Philips Res. Labs., Eindhoven

fYear

2005

fDate

8-8 Nov. 2005

Lastpage

283

Abstract

The Philips RTO7 chip consists of a complete receive chain from RF up to and including digital demodulation for Bluetooth-like radio communication. This paper describes both the implementation and verification of the test and debugs hardware for the digital core of the RTO7. The core-based DfT and DfD flow of the RTO7 is presented. The experimental results show that the RTO7 is both a fully testable and debuggable chip. State dump analysis results are also presented, showing that the state dumps obtained in the application are 100% stable, and match the state dumps made in simulation, and on the digital test system

Keywords

Bluetooth; design for testability; integrated circuit testing; radio links; radiofrequency integrated circuits; Bluetooth-like radio communication; Philips RTO7 chip; debug hardware; design-for-debug; design-for-testability; digital demodulation; digital test system; receive chain; state dump analysis; test hardware; Band pass filters; Communication standards; Demodulation; Design for disassembly; Digital filters; Filtering; Radio frequency; Radiofrequency amplifiers; Streaming media; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2005. Proceedings. ITC 2005. IEEE International

Conference_Location

Austin, TX

Print_ISBN

0-7803-9038-5

Type

conf

DOI

10.1109/TEST.2005.1583985

Filename

1583985