• DocumentCode
    313165
  • Title

    Investigation of minimum inventory variability scheduling policies in a large semiconductor manufacturing facility

  • Author

    Collins, Donald W. ; Hoppensteadt, Frank C.

  • Author_Institution
    Dept. of Manuf. & Aeronaut. Eng. Technol., Arizona State Univ., Mesa, AZ, USA
  • Volume
    3
  • fYear
    1997
  • fDate
    4-6 Jun 1997
  • Firstpage
    1924
  • Abstract
    This paper describes some problems and investigations encountered when implementing new resource scheduling policies in a large semiconductor manufacturing facility (FAB). The FAB described here uses a product release policy based on customer orders and a work-in-progress (WIP) chart. The scheduling of resource tools is done on a first in, first out (FIFO) basis on high speed tools and due date first (DDF) at bottleneck tools, except for high priority LOTS, called MAXIs. This presentation describes briefly the theory behind minimum inventory variability scheduling policies. A heuristic explanation of the minimum inventory variability for resource scheduling policies is given here. Finally a large semiconductor manufacturing facility is discussed in generic terms, including (sanitized) data collection. The results of the baseline output and historical data are compared to MIVSP
  • Keywords
    heuristic programming; production control; resource allocation; semiconductor device manufacture; FIFO resource tool scheduling; MIVSP; WIP chart; bottleneck tools; customer orders; due-date-first resource tool scheduling; heuristic explanation; high-speed tools; large semiconductor manufacturing facility; minimum inventory variability scheduling policies; product release policy; resource scheduling policies; sanitized data collection; work-in-progress chart; Aerospace engineering; Educational institutions; Fabrication; Job shop scheduling; Production facilities; Pulp manufacturing; Queueing analysis; Random variables; Semiconductor device manufacture; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 1997. Proceedings of the 1997
  • Conference_Location
    Albuquerque, NM
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-3832-4
  • Type

    conf

  • DOI
    10.1109/ACC.1997.610920
  • Filename
    610920