DocumentCode :
3131767
Title :
A Comparison of American and Japanese Competitive Product and Manufacturing Process Benchmarking and Reverse Engineering in the Electron Device Industry: Frequency of Use and Perceived Value
Author :
Vojak, Bruce A. ; Hatakeyama, Toshihisa
Author_Institution :
Univ. of Illinois at Urbana-Champaign, Urbana
fYear :
2006
fDate :
17-20 Sept. 2006
Firstpage :
287
Lastpage :
291
Abstract :
A survey of participants in the electron device industry has been conducted to better understand the differences between American and Japanese practitioners of competitive product and manufacturing process benchmarking and reverse engineering (CP/MPBRE). We have studied the responses of n = 221 survey participants who self-describe as new product and manufacturing process engineering practitioners. Consistent with the general literature on this topic, we observe that more Japanese than American engineers in the electron device industry engage in CP/MPBRE. However, expanding on the general literature, we find that, of those who do practice CP/MPBRE, American and Japanese practitioners in this industry do so comparably in terms of frequency of use and perceptions of value. We discuss the implications of these findings.
Keywords :
benchmark testing; electron device manufacture; electronics industry; manufacturing processes; reverse engineering; competitive product; electron device industry; manufacturing process benchmarking; reverse engineering; Computer industry; Electrical products industry; Electron devices; Frequency; Information resources; Manufacturing industries; Manufacturing processes; Product development; Reverse engineering; Technological innovation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering Management Conference, 2006 IEEE International
Conference_Location :
Bahia
Print_ISBN :
1-4244-0285-9
Electronic_ISBN :
1-4244-0286-7
Type :
conf
DOI :
10.1109/IEMC.2006.4279868
Filename :
4279868
Link To Document :
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