• DocumentCode
    3131960
  • Title

    All-Optical Bistability in Photonic Crystal Resonators based on InGaAsP Quantum-Wells

  • Author

    Kim, Myung-ki ; Hwang, In-Kag ; Lee, Yong-Hee

  • Author_Institution
    Dept. of Phys., Korea Adv. Inst. of Sci. & Technol., Seoul
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    769
  • Lastpage
    770
  • Abstract
    We demonstrate extremely low-power all-optical bistability by using photonic crystal linear resonators based on InGaAsP quantum-wells. Since the photonic crystal cavity has a high quality-factor and a small mode-volume, the photon density in the cavity is extremely high, which makes it possible to reduce the bistable power. The measured minimum bistable threshold power was 37 muW by using a fiber coupling technique, and the estimated nonlinear refractive index (n2) was -6.84times10-14 m2/W at a wavelength of 1610.8 nm which is near the resonant wavelength of quantum-well. The low-power optical bistable operations in a single photonic crystal cavity open the possibility of integrated optical devices such as an all-optical memory and switch, based on photonic crystals
  • Keywords
    III-V semiconductors; cavity resonators; gallium arsenide; gallium compounds; indium compounds; integrated optics; nonlinear optics; optical bistability; optical materials; optical resonators; optical testing; photonic crystals; refractive index; semiconductor device testing; semiconductor quantum wells; 1610.8 nm; 37 muW; InGaAsP; all-optical bistability; fiber coupling technique; integrated optical devices; nonlinear refractive index; photon density; photonic crystal linear cavity resonators; quality-factor; semiconductor quantum-wells; Couplings; Optical devices; Optical resonators; Photonic crystals; Power measurement; Quantum well devices; Quantum wells; Refractive index; Resonance; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-9555-7
  • Electronic_ISBN
    0-7803-9555-7
  • Type

    conf

  • DOI
    10.1109/LEOS.2006.278976
  • Filename
    4054411