• DocumentCode
    3132353
  • Title

    Efficiency analysis of electroplating gold bump in assembly

  • Author

    Wang, Mu-Chun ; Huang, Kuo-Shu ; Hsieh, Zhen-Ying ; Tu, Chiao-Hao ; Chen, Shuang-Yuan ; Huang, Heng-Sheng

  • Author_Institution
    Dept. of Electron. Eng., Ming-Hsin Univ. of Sci. & Technol., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    656
  • Lastpage
    659
  • Abstract
    In flat panel displays, the assembly format of driving ICs, due to the rectangular chip shape, is usually with a difference of conventional commercial ICs constructed with a square configuration. Because of this concern, the electroplating gold bump technology in package was desirably developed. Additionally, in the characteristics of hardness, melting point, and stability, gold material is generally better than tin material. Although tin in cost is lower than gold, the previous just can be applied to the soldering joint, but not to the thermal compression process. Therefore, in this study, the electroplating gold bump in assembly was probed in detail to analyze the possibility of mass-production.
  • Keywords
    assembling; electroplating; flat panel displays; gold; soldering; assembly; electroplating gold bump technology; flat panel displays; mass production; melting point; soldering joint; Assembly; Gold;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382271
  • Filename
    5382271