DocumentCode
3132500
Title
Evaluation system of product maturity level for the third generation semiconductor microwave device based on Web
Author
Zhaofeng, Gao ; Jie, Huang ; Kui, Zhang
Author_Institution
China Electron. Technol. Group Corp., Electron. Reliability Eng. & Technol. Co. Ltd., Shijiazhuang, China
Volume
2
fYear
2011
fDate
20-21 Aug. 2011
Firstpage
243
Lastpage
246
Abstract
Aiming at the exigent need of product maturity level evaluation for the third generation semiconductor microwave device and the shortages of current domestic and foreign evaluation methods, this paper extends the traditional Technology Readiness Level (TRL) evaluation method roundly from technology integration and technology dimension, establishes a structural describing and measuring model for product maturity, proposes a quantitative computing method based on questionnaire mode using Analytic Hierarchy Process (AHP) and attribute mathematics, builds a product maturity level evaluation system for the third generation semiconductor microwave device based on Web, and at last realizes an all-round evaluation of product maturity objectively and effectively.
Keywords
Internet; electronic engineering computing; microwave devices; production engineering computing; World Wide Web; analytic hierarchy process; evaluation system; product maturity level; technology readiness level; third generation semiconductor microwave device; Analytical models; Manufacturing; Materials; Microwave communication; Microwave devices; microwave device; product maturity level; technology dimension; technology integration; the third generation semiconductor;
fLanguage
English
Publisher
ieee
Conference_Titel
Computing, Control and Industrial Engineering (CCIE), 2011 IEEE 2nd International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-9599-3
Type
conf
DOI
10.1109/CCIENG.2011.6008111
Filename
6008111
Link To Document