• DocumentCode
    3132867
  • Title

    MD study of damage structures with poly-atomic boron cluster implantation

  • Author

    Aoki, Takaaki ; Seki, Takaya ; Matsuo, Jiro

  • Author_Institution
    Kyoto Univ., Kyoto
  • fYear
    2007
  • fDate
    8-9 June 2007
  • Firstpage
    23
  • Lastpage
    24
  • Abstract
    The MD simulations of B monomer and small cluster implantation were performed. The non-linear effect for implant range was observed when the incident energy is as low as few hundreds eV/atom, where the B10 or B18 cluster implantation gives deeper implantation energy and so higher implant efficiency of dopants than that of B monomer or dimer. For damage formation, cluster implantation caused large number of collisions at narrow surface region, which results in high-density amorphization of impact area. This amorphization effect was observed at both low and high energy cluster ion implantation, and is expected to reduce enhanced diffusion and show good annihilation process.
  • Keywords
    amorphisation; boron; elemental semiconductors; ion implantation; molecular dynamics method; semiconductor doping; semiconductor junctions; silicon; B monomer; MD simulations; Si:B; annihilation process; damage structures; high energy cluster ion implantation; high-density amorphization; molecular dynamics simulations; nonlinear effect; polyatomic boron cluster implantation; small cluster implantation; Annealing; Atomic layer deposition; Boron; Fabrication; Implants; Ion implantation; Large scale integration; Lattices; Projectiles; Semiconductor process modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Junction Technology, 2007 International Workshop on
  • Conference_Location
    Kyoto
  • Print_ISBN
    1-4244-1103-3
  • Electronic_ISBN
    1-4244-1104-1
  • Type

    conf

  • DOI
    10.1109/IWJT.2007.4279937
  • Filename
    4279937