DocumentCode
3132867
Title
MD study of damage structures with poly-atomic boron cluster implantation
Author
Aoki, Takaaki ; Seki, Takaya ; Matsuo, Jiro
Author_Institution
Kyoto Univ., Kyoto
fYear
2007
fDate
8-9 June 2007
Firstpage
23
Lastpage
24
Abstract
The MD simulations of B monomer and small cluster implantation were performed. The non-linear effect for implant range was observed when the incident energy is as low as few hundreds eV/atom, where the B10 or B18 cluster implantation gives deeper implantation energy and so higher implant efficiency of dopants than that of B monomer or dimer. For damage formation, cluster implantation caused large number of collisions at narrow surface region, which results in high-density amorphization of impact area. This amorphization effect was observed at both low and high energy cluster ion implantation, and is expected to reduce enhanced diffusion and show good annihilation process.
Keywords
amorphisation; boron; elemental semiconductors; ion implantation; molecular dynamics method; semiconductor doping; semiconductor junctions; silicon; B monomer; MD simulations; Si:B; annihilation process; damage structures; high energy cluster ion implantation; high-density amorphization; molecular dynamics simulations; nonlinear effect; polyatomic boron cluster implantation; small cluster implantation; Annealing; Atomic layer deposition; Boron; Fabrication; Implants; Ion implantation; Large scale integration; Lattices; Projectiles; Semiconductor process modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Junction Technology, 2007 International Workshop on
Conference_Location
Kyoto
Print_ISBN
1-4244-1103-3
Electronic_ISBN
1-4244-1104-1
Type
conf
DOI
10.1109/IWJT.2007.4279937
Filename
4279937
Link To Document