DocumentCode
3132897
Title
Performance analysis in modeling micro capacitive pressure sensor
Author
Tsui, Chun-Shan
Author_Institution
Pitotech, Changhua, Taiwan
fYear
2009
fDate
21-23 Oct. 2009
Firstpage
39
Lastpage
42
Abstract
In this paper, a finite element numerical (FEM) simulation via COMSOL Multiphysics was carried out to study the performance of micro capacitive pressure sensor. At first stage, the effect of fabrication was considered. At second stage, calculating the relationship between capacitance and applied pressure under different operation condition, including bonding temperature, thermal expansion coefficient of silicon and thickness of pressurized compartment by using Taguchi Method. Finally, finding the best condition of fabrication and operation. The simulation showed that capacitance of the sensor was as the function of the operating pressure. The higher bonding temperature was fabricated, the lower capacitance can be achieved under the same applied load. And thinner thickness of the pressurized compartment provided good resolution. Thus, the performance of micro capacitive pressure sensor can be predicted with qualitative analysis and with quantitative analysis via numerical simulation.
Keywords
Taguchi methods; capacitance; capacitive sensors; elemental semiconductors; finite element analysis; microsensors; pressure sensors; silicon; thermal expansion; COMSOL Multiphysics; Taguchi method; bonding temperature; capacitance; finite element numerical simulation; microcapacitive pressure sensor; performance analysis; pressurized compartment; quantitative analysis; thermal expansion coefficient; Bonding; Capacitance; Capacitive sensors; Fabrication; Finite element methods; Numerical simulation; Performance analysis; Silicon; Temperature sensors; Thermal expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location
Taipei
Print_ISBN
978-1-4244-4341-3
Electronic_ISBN
978-1-4244-4342-0
Type
conf
DOI
10.1109/IMPACT.2009.5382303
Filename
5382303
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