Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring

The inter-die and intra-die variations in process parameters result in large number of failures in an SRAM array degrading the design yield. In this paper, we propose an adaptive repairing technique for SRAM based on leakage and delay monitoring. Leakage and delay monitoring is used to effectively separate dies with different inter-die Vts from each other. Using the leakage (or delay) monitoring and adaptive body bias, we propose a reliable and self-repairing SRAM which has reduced number of parametric failures under high inter-die and intra-die Vt variations. The proposed self-repairing SRAM improves the design yield by 5%-40% in predictive 70nm technology from BPTM