Title :
A test point selection method for data converters using Rademacher functions and wavelet transforms
Author :
Carter, Chandra ; Ang, Simon
Author_Institution :
Texas Instruments Inc., Dallas, TX
Abstract :
A new test method of linearity errors for data converters is presented. Based in principle of the test point selection (NIST) method, this test method combines Rademacher functions and wavelet transforms to create a linearity error model for the data converter. Test results from an analog-to-digital converter and a digital-to-analog converter are presented and compared to other reported methods
Keywords :
analogue-digital conversion; digital-analogue conversion; integrated circuit modelling; wavelet transforms; Rademacher functions; analog-to-digital converter; data converters; digital-to-analog converter; linearity error model; test point selection method; wavelet transforms; Analog-digital conversion; Circuits; Instruments; Linearity; NIST; Predictive models; Signal resolution; Testing; Vectors; Wavelet transforms;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584087
