DocumentCode
3133057
Title
Investigation of the effect of the slot and shunt on the transient and steady state current response of a commercially available lighting ballast
Author
Brosius, Bill ; Lambrecht, Robert ; Oesterlei, Robert ; Sadeghi, Hamid
Author_Institution
Adv. Dev. Center, MagneTek Inc., USA
Volume
4
fYear
1996
fDate
6-10 Oct 1996
Firstpage
2095
Abstract
Shunts and slots in electromagnetic ballasts control starting and steady state currents. Conventional methods of analysis fall short in an accurate qualitative and quantitative description of the effect of these important design parameters because their function can be explained only when steel saturation and material nonlinearity are considered. Because of the existence of the shunts, parallel paths for the flux lines exist, thus making conventional methods of analysis extremely difficult when nonlinear material characteristics have to be taken into account. As a result, this kind of electromagnetic ballast has traditionally been designed using more empirical rules and trial and error (build-test) methods than theoretical methods. This study tries to give a comprehensive understanding of the function of the shunts and slots in an electromagnetic ballast. The commercially available finite element package MSC/EMAS was used in this study. MKS units are used throughout the analysis
Keywords
electrical engineering computing; electromagnetic devices; finite element analysis; lamp accessories; lighting; software packages; starting; MSC/EMAS software; design parameters; electromagnetic lighting ballasts; finite element package; material nonlinearity; parallel path flux lines; shunts; slots; steady-state current response; steel saturation; transient current response; Electromagnetic transients; Electronic ballasts; Finite element methods; Magnetic flux; Magnetic separation; Steady-state; Steel; Surges; Transient analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96., Conference Record of the 1996 IEEE
Conference_Location
San Diego, CA
ISSN
0197-2618
Print_ISBN
0-7803-3544-9
Type
conf
DOI
10.1109/IAS.1996.563864
Filename
563864
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