DocumentCode :
3133069
Title :
Fundamental study of 95 high-lead solder bump on substrates pre-soldered with eutectic PbSn
Author :
Chang, Chih-Chiang ; Lin, Chun-Cheng ; Kao, C. Robert
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2009
fDate :
21-23 Oct. 2009
Firstpage :
72
Lastpage :
75
Abstract :
This study investigated the intermixing of 95Pb5Sn solder bumps and 37Pb63Sn pre-solder in flip-chip solder joints. The reaction conditions included multiple reflows (up to 10) at 240°C, whereby previously solder-coated parts are joined by heating without using additional solder. We found that the molten pre-solder had an irregular shape similar to a calyx (i.e., a cuplike structure) wrapped around a high-lead solder bump. The height to which the molten pre-solder ascended along the solid high-lead solder bump increased with the number of reflows. The molten pre-solder was able to reach the UBM/95Pb5Sn interface after three to five reflows. The molten pre-solder at the UBM/95Pb5Sn interface generated two important phenomena: (1) the molten solder dewetted (i.e., flowed away from the soldered surface) along the UBM/95Pb5Sn interface, particularly when the number of reflows was high, and (2) the molten pre-solder transported Cu atoms to the UBM/95Pb5Sn interface, which in turn caused the Ni-Sn compounds at the chip-side interface to change into (Cu0.6Ni0.4)6Sn5.
Keywords :
eutectic alloys; flip-chip devices; lead alloys; soldering; tin alloys; PbSn; chip-side interface; flip-chip solder joints; high-lead solder bump; molten presolder; substrates presoldering; Flip chip solder joints; Heating; Shape; Solids; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
Type :
conf
DOI :
10.1109/IMPACT.2009.5382312
Filename :
5382312
Link To Document :
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