DocumentCode
3133418
Title
Methods for improving test compression
Author
Touba, Nur A.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
1293
Abstract
The approach that the author takes for this panel is to start with a vanilla sequential linear decompressor and look at the results it obtains. Then the author adds different enhancements to it along the lines of the factors discussed here and see what impact these have on the results
Keywords
automatic test pattern generation; built-in self test; semiconductor device testing; sequential circuits; ATPG; test compression; vanilla sequential linear decompressor; Automatic test pattern generation; Broadcasting; Circuit testing; Entropy; Hardware; Nonlinear equations; Sequential analysis; Sequential circuits; Upper bound; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584115
Filename
1584115
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