DocumentCode :
3133508
Title :
Improved selective growth of InP around dry-etched mesas by LP-MOCVD at low growth temperature
Author :
Takemi, M. ; Kimura, T. ; Miura, T. ; Mihashi, Y. ; Takamiya, S.
Author_Institution :
Optoelectron. & Microwave Devices R&D Lab., Mitsubishi Electr. Corp., Hyogo, Japan
fYear :
1995
fDate :
9-13 May 1995
Firstpage :
333
Lastpage :
336
Abstract :
We applied a high-speed rotating-disk MOCVD reactor to the selective embedding growth around the mesas formed by reactive ion etching (RIE), and investigated the growth conditions which give planar embedding around the mesas. It is shown that almost planar embedding growth can be achieved even at low growth temperature without introducing any chlorine compounds. Moreover, we discuss the effects of dopants on the behaviors in the selective embedding growth. Special attention has been focused on the growth on the side walls of the nearly-rectangular mesas as well as that near the edges of the masks
Keywords :
III-V semiconductors; indium compounds; semiconductor doping; semiconductor growth; sputter etching; vapour phase epitaxial growth; 50 to 150 torr; 580 to 660 degC; InP; LP-MOCVD; dopant effects; dry-etched mesas; growth conditions; high-speed rotating-disk MOCVD reactor; improved selective growth; low growth temperature; nearly-rectangular mesas; planar embedding; reactive ion etching; selective embedding growth; side walls; Chemical lasers; Chemical vapor deposition; Diode lasers; Indium phosphide; Inductors; MOCVD; Microwave devices; Microwave theory and techniques; Scanning electron microscopy; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
Conference_Location :
Hokkaido
Print_ISBN :
0-7803-2147-2
Type :
conf
DOI :
10.1109/ICIPRM.1995.522147
Filename :
522147
Link To Document :
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