DocumentCode
3133536
Title
Guaranteed by design or guaranteed to fail or guaranteed by test? or ... neither?
Author
Soma, Mani
Author_Institution
Washington Univ., Seattle, WA
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
1307
Abstract
The interaction between design and test is a matter of great importance in high-speed RF product development. In this paper, the guaranteed-by-design concept was evaluated. The quest for "guaranteed by design" increasingly runs into obstacles for various reasons
Keywords
integrated circuit design; integrated circuit testing; product development; guaranteed-by-design concept; high-speed RF product development; product testing; Algorithm design and analysis; Circuit simulation; Costs; Fabrication; Manufacturing processes; Predictive models; Product development; Radio frequency; Solid modeling; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584124
Filename
1584124
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