Title :
Achieving higher yield through diagnosis?
Author :
Venkataraman, Srikanth
Author_Institution :
Intel Corp., Hillsboro, OR
Abstract :
Given the trends in manufacturing process, design and their interaction can diagnosis play a greater and more central role in achieving higher yields? Can automated logic diagnosis solutions become a fundamental driver of yield improvement or will it just remain a secondary endeavor?
Keywords :
fault diagnosis; integrated circuit testing; integrated circuit yield; integrated circuit design; logic diagnosis solutions; manufacturing process; yield improvement; Circuits; Crosstalk; Failure analysis; Logic; Manufacturing processes; Optical noise; Process design; Profitability; Silicon; Timing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584129
