DocumentCode
3133597
Title
Achieving higher yield through diagnosis?
Author
Venkataraman, Srikanth
Author_Institution
Intel Corp., Hillsboro, OR
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
1314
Abstract
Given the trends in manufacturing process, design and their interaction can diagnosis play a greater and more central role in achieving higher yields? Can automated logic diagnosis solutions become a fundamental driver of yield improvement or will it just remain a secondary endeavor?
Keywords
fault diagnosis; integrated circuit testing; integrated circuit yield; integrated circuit design; logic diagnosis solutions; manufacturing process; yield improvement; Circuits; Crosstalk; Failure analysis; Logic; Manufacturing processes; Optical noise; Process design; Profitability; Silicon; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584129
Filename
1584129
Link To Document