• DocumentCode
    3134072
  • Title

    Characteristics of iron doped Pt-InAlAs Schottky diodes grown by LP-MOCVD using ferrocene

  • Author

    Hong, K. ; Pavlidis, D. ; Sejalon, F.

  • Author_Institution
    Solid State Electron. Lab., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1995
  • fDate
    9-13 May 1995
  • Firstpage
    432
  • Lastpage
    435
  • Abstract
    Iron doped InAlAs layers were grown by MOCVD with the purpose of improving the electrical properties of this material. Photoreflectance studies clearly showed the increase of deep traps by introducing iron into the layers. Pt-Schottky diodes were fabricated on undoped and iron doped InAlAs with various iron concentrations and device parameters were extracted to reveal the impact of iron concentration on the electrical characteristics. Although iron doped layers showed lower Schottky barrier height, extremely high reverse breakdown voltage of ~90 V could be obtained with properly doped materials. The results showed that the electrical properties of InAlAs can be greatly improved if an appropriate level of iron doping is employed. Beyond certain level of ferrocene flow, the material starts presenting less pronounced semi-insulating characteristics, possibly due to the presence of iron precipitates. Low frequency noise current spectra of iron doped InAlAs showed a Lorentz-shaped spectrum near ~40 Hz suggesting an increased presence of traps with high activation energy in InAlAs:Fe
  • Keywords
    III-V semiconductors; Schottky barriers; Schottky diodes; aluminium compounds; deep levels; indium compounds; photoreflectance; platinum; semiconductor device noise; semiconductor doping; semiconductor growth; time resolved spectra; vapour phase epitaxial growth; 10 Hz to 100 kHz; 90 V; Fe concentration; Fe doping; Fe precipitates; LP-MOCVD; Lorentz-shaped spectrum; Pt-InAlAs:Fe; Pt-InAlAs:Fe Schottky diodes; Schottky barrier height; deep traps; electrical characteristics; electrical properties; ferrocene; high activation energy traps; low frequency noise current spectra; photoreflectance; reverse breakdown voltage; semi-insulating characteristics; time resolved optical reflectance; Doping; HEMTs; Indium compounds; Inductors; Iron; MOCVD; MODFETs; Optical buffering; Optical materials; Schottky diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
  • Conference_Location
    Hokkaido
  • Print_ISBN
    0-7803-2147-2
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1995.522172
  • Filename
    522172