• DocumentCode
    3134485
  • Title

    High-efficiency monolithic InGaP/GaAs tandem solar cells with improved top-cell back-surface-field layers

  • Author

    Kurita, H. ; Takamoto, T. ; Ikeda, E. ; Ohmori, M.

  • Author_Institution
    Central Res. Lab., Japan Energy Corp., Saitama, Japan
  • fYear
    1995
  • fDate
    9-13 May 1995
  • Firstpage
    516
  • Lastpage
    519
  • Abstract
    Improved back-surface-field (BSF) layers have been adapted for the top cell of a two-terminal, monolithic InGaP/GaAs dual-junction cell in order to recover the top-cell quantum efficiency, which had been reduced significantly by the diffusion of zinc from the p+-InGaP BSF into the top-cell base layer. A thick p+-InGaP layer and a thin p-AlInP layer have proved to be effective in improving the top-cell quantum efficiency, especially in the long-wavelength region. Although the current-matching between the top- and bottom-cells was not complete, tandem cells with those BSF layers obtained high conversion efficiencies of 27.3% and 26.4%, respectively
  • Keywords
    III-V semiconductors; diffusion; gallium arsenide; gallium compounds; indium compounds; integrated optoelectronics; solar cells; 26.4 percent; 27.3 percent; AlInP; InGaP-GaAs; back-surface-field layers; current-matching; diffusion; high conversion efficiencies; high-efficiency monolithic InGaP/GaAs tandem solar cells; long-wavelength region; monolithic InGaP/GaAs dual-junction cell; p+-InGaP BSF; tandem cells; thick p+-InGaP layer; thin p-AlInP layer; top-cell back-surface-field layers; top-cell base layer; top-cell quantum efficiency; two-terminal; Charge carrier lifetime; Diodes; Doping; Electrons; Gallium arsenide; Life estimation; Photonic band gap; Photovoltaic cells; Spontaneous emission; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on
  • Conference_Location
    Hokkaido
  • Print_ISBN
    0-7803-2147-2
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1995.522193
  • Filename
    522193