• DocumentCode
    3135328
  • Title

    Design and development of compact spiral ribbed cooling unit for electronic chipsets with high power densities

  • Author

    Woei, Chang Shyy ; Feng, Chiang Kuei ; Huiru, Wang ; Chin, Huang Chuan ; Ken, Kao Juei

  • Author_Institution
    Thermal Fluids Lab., Nat. Kaohsiung Marine Univ., Kaohsiung, Taiwan
  • fYear
    2011
  • fDate
    20-24 March 2011
  • Firstpage
    231
  • Lastpage
    238
  • Abstract
    This paper presents the results of a set of numerical and experimental studies for flow and heat transfer in a spiral channel roughened by skew ribs over two opposite endwalls. The experimental Nusselt number (Nu) distributions, pressure drop coefficients (f) and thermal performance factors (η) for the spiral ribbed channel are examined along with the flow structures determined from the CFD analysis. The comparisons of Heat Transfer Enhancement (HTE) ratios measured from the ribbed spiral channel with other passive types of HTE devices confirm the favorable HTE performances for the spiral channel with the in-line skew ribs. A subsequent design and product development for the liquid cooling unit using the ribbed spiral channel is described with the pressure drops and thermal resistances presented. This study confirms the availability of the enhanced liquid cooling performance using the spiral ribbed channel for the electronic chipset(s) with higher power densities.
  • Keywords
    cooling; electronic products; power electronics; thermal resistance; Nusselt number distributions; compact spiral ribbed cooling unit; electronic chipsets; flow transfer; heat transfer; high power densities; pressure drop coefficients; skew ribs; spiral channel; thermal performance factors; thermal resistances; Cooling; Electron tubes; Fluids; Heat transfer; Ribs; Spirals; Temperature measurement; Cooling High Power Electronics; Spiral Ribbed Channel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-61284-740-5
  • Type

    conf

  • DOI
    10.1109/STHERM.2011.5767206
  • Filename
    5767206