Title :
Stochastic net length distributions for global interconnects in a heterogeneous system-on-a-chip
Author :
Zarkesh-Ha, P. ; Meindl, J.D.
Author_Institution :
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
The stochastic net length distribution for global interconnects in a non-homogeneous system-on-a-chip is derived using novel models for netlist information, placement information and routing information. Through comparison with actual product data, it is shown that the new stochastic models successfully predict the global net length distribution of a heterogeneous system.
Keywords :
integrated circuit interconnections; integrated circuit modelling; stochastic processes; global interconnect; heterogeneous system-on-a-chip; net length distribution; netlist information; placement information; routing information; stochastic model; Application specific integrated circuits; Distributed computing; Microelectronics; Pins; Predictive models; Routing; Stochastic processes; Stochastic systems; System-on-a-chip; Wiring;
Conference_Titel :
VLSI Technology, 1998. Digest of Technical Papers. 1998 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-4770-6
DOI :
10.1109/VLSIT.1998.689192
