DocumentCode :
3136194
Title :
An RF-MEMS switch with mN contact forces
Author :
Patel, Chirag D. ; Rebeiz, Gabriel M.
Author_Institution :
Univ. of California, San Diego, La Jolla, CA, USA
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1242
Lastpage :
1245
Abstract :
This paper presents a new RF MEMS switch design which is capable of generating large forces under electrostatic actuation. The switch is 155 × 130 μm2, and results in 0.8-1.8 mN of contact force at 80-100 V, with a release force of 0.50 mN. The design is also highly insensitive to biaxial stress and to stress gradients. A prototype switch, fabricated on a high resistivity silicon substrates using an 8 μm-thick gold cantilever, results in pull-in voltage of 62 V, a switching time of 6 μs, and an upstate capacitance of 24 fF. The contact metal is Au-Ru and the measured switch resistance dropped from 250 Ω to 1.2 Ω for Vact = 60 - 100 V, showing the large contact-force operation of the switch. Measurements versus temperature show excellent stability from 25 - 105°C.
Keywords :
microswitches; RF MEMS switch design; biaxial stress; capacitance 24 fF; contact force operation; electrostatic actuation; high resistivity silicon substrates; resistance 1.2 ohm; resistance 250 ohm; size 8 mum; stress gradients; switch resistance; temperature 25 C to 105 C; time 6 mus; upstate capacitance; voltage 60 V to 100 V; Conductivity; Contacts; Electrical resistance measurement; Electrostatic actuators; Prototypes; Radiofrequency microelectromechanical systems; Silicon; Stress; Switches; Temperature measurement; RF MEMS; contact switch; hard metal contact; high force; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5517237
Filename :
5517237
Link To Document :
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