• DocumentCode
    3136293
  • Title

    Measurement of a Markov jump process by hypothesis tests

  • Author

    O´Connor, Alan C.

  • Author_Institution
    Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
  • fYear
    2011
  • fDate
    19-21 Dec. 2011
  • Firstpage
    650
  • Lastpage
    655
  • Abstract
    This paper considers measurement of a continuous-time finite-state Markov jump process. The measurements take the form of hypothesis tests, which determine whether the system is in an inspected state or not. This model is relevant to determining policies for performing medical exams, inspecting machinery, and tracking targets. Measurement policies are selected so as to minimize an average cost criterion that penalizes both uncertainty about the state of the system and the frequency of measurements. Unlike observation control for LQG systems, where the optimal input to a Kalman filter may be selected by an open-loop policy, for Markov jump processes, the optimal measurement schedule depends on the outcomes of prior measurements. The policy iteration algorithm is shown to give a convergent method for finding optimal feedback measurement rules. The model is applied to find the optimal screening frequency for diabetes.
  • Keywords
    Kalman filters; continuous time systems; diseases; feedback; health care; linear quadratic Gaussian control; medical control systems; open loop systems; stochastic systems; target tracking; Kalman filter; LQG systems; average cost criterion minimization; continuous-time finite-state Markov jump process measurement; diabetes; hypothesis tests; machinery inspection; medical exams; observation control; open-loop policy; optimal feedback measurement rules; optimal measurement schedule; optimal screening frequency; stochastic systems; target tracking; Current measurement; Diabetes; Diseases; Equations; Markov processes; Process control; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Automation (ICCA), 2011 9th IEEE International Conference on
  • Conference_Location
    Santiago
  • ISSN
    1948-3449
  • Print_ISBN
    978-1-4577-1475-7
  • Type

    conf

  • DOI
    10.1109/ICCA.2011.6137894
  • Filename
    6137894