DocumentCode :
3136676
Title :
Refined characterization of E-plane waveguide to microstrip transition for millimeter-wave applications
Author :
Tikhov, Yuri ; Moon, Jeong-Woo ; Kim, Yuon-Jin ; Sinelnikov, Yuri
Author_Institution :
LG Precision Co. Ltd., Kyunggi, South Korea
fYear :
2000
fDate :
2000
Firstpage :
1187
Lastpage :
1190
Abstract :
This paper presents a new algorithm for the analysis and design of an E-plane waveguide-to-microstrip transition. The theory is based on the generalised scattering matrix technique in conjunction with the spectral-domain approach and space-domain integral equation method. The full 2D current vector distribution on the probe, as well as influence of the dielectric edge, are taken into account for calculation of the generalised S-parameters. Analytical and experimental results are shown for a W-band transition
Keywords :
S-matrix theory; S-parameters; current distribution; integral equations; millimetre wave devices; spectral-domain analysis; waveguide theory; waveguide transitions; 2D current vector distribution; E-plane waveguide to microstrip transition; EHF; MM-wave applications; W-band transition; dielectric edge; generalised S-parameters; generalised scattering matrix technique; millimeter-wave applications; probe; space-domain integral equation method; spectral-domain approach; transition characterization; Algorithm design and analysis; Dielectric substrates; Electromagnetic waveguides; Impedance; Microstrip; Microwave circuits; Millimeter wave technology; Probes; Transmission line matrix methods; Waveguide transitions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2000 Asia-Pacific
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-6435-X
Type :
conf
DOI :
10.1109/APMC.2000.926043
Filename :
926043
Link To Document :
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