DocumentCode
3137899
Title
Series resistance and its effect on the maximum output power of 1.5 μm strained-layer multiple-quantum-well ridge waveguide InGaAsP lasers
Author
Simmons, J.G. ; Elenkrig, B.B. ; Smetona, S. ; Takasaki, B. ; Evans, J.D.
Author_Institution
Centre for Electrophotonic Mater. & Devices, McMaster Univ., Hamilton, Ont., Canada
fYear
1999
fDate
1999
Firstpage
120
Lastpage
123
Abstract
The series resistance of InGaAsP/InP Multiple Quantum Well ridge waveguide laser diodes is investigated experimentally over a wide temperature range for both Fabry-Perot and Distributed Feedback type lasers. From the temperature dependence of the series resistance is found that it is defined mostly by the resistance of heterobarriers, although the semiconductor bulk resistance is also found to be a substantial part of ridge waveguide laser series resistance. The effect of the laser series resistance on its performance characteristics is investigated. The theoretically predicted strong correlation between the series resistance and laser maximum operating power is confirmed experimentally. The ways of reducing of series resistance are discussed
Keywords
III-V semiconductors; distributed feedback lasers; electrical resistivity; gallium arsenide; gallium compounds; indium compounds; quantum well lasers; ridge waveguides; semiconductor device measurement; waveguide lasers; Fabry-Perot type lasers; InGaAsP-InP; InGaAsP/InP; MQW ridge waveguide laser diodes; distributed feedback type lasers; heterobarriers; laser maximum operating power; maximum output power; performance characteristics; ridge waveguide laser series resistance; semiconductor bulk resistance; series resistance; strained-layer multiple-quantum-well ridge waveguide InGaAsP lasers; temperature dependence; Diode lasers; Distributed feedback devices; Indium phosphide; Laser feedback; Laser theory; Power generation; Semiconductor lasers; Semiconductor waveguides; Temperature distribution; Waveguide lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
Conference_Location
Perth, WA
Print_ISBN
0-7803-4513-4
Type
conf
DOI
10.1109/COMMAD.1998.791598
Filename
791598
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